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Wired Communications

Accelerate PCIe, SAS and SATA testing with a single test solution including automation and debug capabilities. Speed up your 400G product development with PAM4 testing to efficiently validate your technology advances. Get to compliance faster with your Type-C devices.

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400G PAM4 Testing

  • Optical Manufacturing Tests for 400G
  • Accelerate 400G product development
  • Validate faster and increase yield
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Coherent Optical

  • No more trial and error
  • Automate to reduce calibration times and measure accurately
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PCIe, SAS, SATA
Test and Debug

  • Automate calibration
  • Close the loop on loopback debug
  • Superior signal integrity and debug
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Consumer Standards Over Type-C

  • Get to compliance faster for next gen USB, DisplayPort, HDMI
  • Build confidence on the margin of devices
  • Avoid expensive overdesigning

More applications in Wired Communications:

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Using Attenuators with Oscilloscopes
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Efficient Verification and Debugging for DDR5 Memory Interfaces
Get an overview of the Tektronix TekExpress DDR5 Transmitter Solution, an automated system-level test application that lets you quickly, efficiently and reliably validate and debug DDR5 designs to …
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PCIe Gen5 Flyer
Get an overview of Tektronix’s PCIe Gen5 solution for  transmitter testing across x1, x4, x8, or x16 links with flexible test configurations and comprehensive reporting. For full detail see …
USB4 Flyer
Get an overview of our USB4 Transmitter Solution and learn how it can streamline the USB4 compliance testing journey. We designed our solution with custom test environments in mind so that designers …
PCIe Gen 5 Tx Tech Brief
Background With the expected dramatic rise in the number of internetconnected devices and associated high bandwidth requirements of 5G and Internet of Things (IoT), data center …
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HDMI 2.1 Test Challenges
HDMI specification version 2.1 is the most recent update of the HDMI standards and supports a range of higher video resolutions and refresh rates, including 8K60 and 4K120. Watch this presentation …
Solving 400G Data Center Interconnect Measurement Challenges
This webinar will equip you to address the challenges posed by the forthcoming interoperability standards. OIF standards for interoperability of 400G coherent links for Data Center Interconnects (DCI) …
Addressing PCIe Gen1-5 Test and Debug Challenges with Confidence
Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and …
PCI Express Gen 5 Reference Clock Webinar
This webinar presents an overview of reference clock jitter requirements as they have evolved and offers techniques for making these low femtosecond measurements using a real time oscilloscope. 
PCI Express Gen 5 Update Webinar
Cloud-based computing power, storage capacity, and network bandwidth have led to the development of the PCI Express 5.0 specification for 32.0 GT/s. This webinar starts with an overview of 5.0 …